First-level areas：Materials, new materials
First-level areas：Nanomaterials
Source：Social Recruitment
Job description ：
Research on defect detection of semiconductor/graphic wafer/non graphic wafer
Research direction description. This study aims to explore and develop high-precision semiconductor/wafer defect detection equipment
1) Analyze the technical characteristics of high-precision detection equipment such as Surfscan SP series, Puma 9980 laser scanning detector, Candela series surface defect detection, and explore their role in improving semiconductor manufacturing yield.
2) Identification and classification of typical defects, establishment of sample libraries for various types of defects.
3) Measurement principle, hardware system design and construction of wafer inspection equipment.
4) Multi channel detection technology, big data analysis, and AI big models.

Please send your CV or resume as an attachment to the following email address:
mailto: rbhr@hrcenter.co.uk
With the subject line formatted as: ‘Name + Position + Company Name + Location’.