First-level areas：Materials, new materials
First-level areas：Nanomaterials
Source：Social Recruitment
Job description ：
Semiconductor/graphic wafer/non graphic wafer defect detection
Research direction description. This study aims to explore and develop high-precision semiconductor/wafer defect detection equipment;
1) Analyzing Surfscan- SP series Puma- The technical characteristics of high-precision detection equipment such as 9980 laser scanning detector and Candela series surface defect detection are discussed, and their role in improving semiconductor manufacturing yield is explored.
2) Identification and classification of typical defects, establishment of sample libraries for various types of defects.
3) Measurement principle, hardware system design and construction of wafer inspection equipment.
4) Multi channel detection technology, big data analysis, and AI big models.

Please send your CV or resume as an attachment to the following email address:
mailto: rbhr@hrcenter.co.uk
With the subject line formatted as: ‘Name + Position + Company Name + Location’.